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Call for Papers: 44th IEEE Semiconductor Interface Specialists Conference - Submission Deadline: July 22, 2013.

Source :
IEEE Transactions on Electron Devices. Jun2013, Vol. 60 Issue 6, p2090-2090. 1p.
Publication Year :
2013

Abstract

The SISC is a workshop-style conference that provides a forum for device engineers, solid state physicists, and materials scientists to discuss topics of common interest, formally through invited and contributed presentations, and informally during various events including a poster presentation session. The SISC is sponsored by the IEEE Electron Devices Society, and will be held immediately prior to the IEEE IEDM. The program includes talks (theory and experiment) from all areas of MOS science and technology. A Best Student Presentation Award will be given in memory of E.H. Nicollian. Deadline for Receipt of Extended Abstracts: July 22, 2013 Abstract submission, previous technical programs, contact information, etc.: http://www.ieeesisc.org. Key Bridge Marriott Hotel, Arlington, VA (near downtown Washington, DC) December 5-7,2013 (Tutorial: December 4). [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
60
Issue :
6
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
87693883
Full Text :
https://doi.org/10.1109/TED.2013.2263744