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A New Framework of Simultaneous-Fault Diagnosis Using Pairwise Probabilistic Multi-Label Classification for Time-Dependent Patterns.
- Source :
-
IEEE Transactions on Industrial Electronics . Aug2013, Vol. 60 Issue 8, p3372-3385. 14p. - Publication Year :
- 2013
-
Abstract
- Simultaneous-fault diagnosis is a common problem in many applications and well-studied for time-independent patterns. However, most practical applications are of the type of time-dependent patterns. In our study of simultaneous-fault diagnosis for time-dependent patterns, two key issues are identified: 1) the features of the multiple single faults are mixed or combined into one pattern which makes accurate diagnosis difficult, 2) the acquisition of a large sample data set of simultaneous faults is costly because of high number of combinations of single faults, resulting in many possible classes of simultaneous-fault training patterns. Under the assumption that the time-frequency features of a simultaneous fault are similar to that of its constituent single faults, these issues can be effectively resolved using our proposed framework combining feature extraction, pairwise probabilistic multi-label classification, and decision threshold optimization. This framework has been applied and verified in automotive engine-ignition system diagnosis based on time-dependent ignition patterns as a test case. Experimental results show that the proposed framework can successfully resolve the issues. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 02780046
- Volume :
- 60
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Industrial Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 86989343
- Full Text :
- https://doi.org/10.1109/TIE.2012.2202358