Linear temperature scaling of ferroelectric hysteresis in Mn-doped Pb(Mn1/3Sb2/3)O3-Pb(Zr,Ti)O3 ceramic with internal bias field.

The temperature scaling of dynamic hysteresis was investigated in Mn-doped Pb(Mn1/3Sb2/3)O3-Pb(Zr,Ti)O3 ceramic with internal bias field. A set of simple linear temperature scaling relations were established for hysteresis area <A>, coercivity Ec, and internal bias field Ei, which are different from the power-law scaling relationships for the soft and hard PZT ceramics. The proposed scaling relation between <A> and T can be predicted by the temperature dependent response of Ec and vice versa. It is suggested that the thermal deaging which related to the redistribution of the preferentially oriented defect dipoles is responsible for these dynamic hysteresis behaviors. [ABSTRACT FROM AUTHOR]