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Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules.

Authors :
Mohn, Fabian
Schuler, Bruno
Gross, Leo
Meyer, Gerhard
Source :
Applied Physics Letters. 2/18/2013, Vol. 102 Issue 7, p073109-073109-4. 1p. 3 Black and White Photographs.
Publication Year :
2013

Abstract

We explore different tip functionalizations for atomic force microscopy (AFM), scanning tunneling microscopy (STM), and Kelvin probe force microscopy (KPFM) of organic molecules on thin insulating films. We describe in detail how tips terminated with single Br and Xe atoms can be created. The performance of these tips in AFM, STM, and KPFM imaging of single molecules is compared to other tip terminations, and the advantages and disadvantages of the different tips are discussed. The Br tip was found to be particularly useful for AFM and lateral manipulation, whereas the Xe tip excelled in STM and KPFM. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
102
Issue :
7
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
85738651
Full Text :
https://doi.org/10.1063/1.4793200