Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress.

MLA

Rech, P., et al. “Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress.” IEEE Transactions on Nuclear Science, vol. 59, no. 4, Apr. 2012, pp. 893–99. EBSCOhost, https://doi.org/10.1109/TNS.2012.2187218.

APA

Rech, P., Galliere, J.-M., Girard, P., Griffoni, A., Boch, J., Wrobel, F., Saigne, F., & Dilillo, L. (2012). Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress. IEEE Transactions on Nuclear Science, 59(4), 893–899. https://doi.org/10.1109/TNS.2012.2187218

Chicago

Rech, P., J.-M. Galliere, P. Girard, A. Griffoni, J. Boch, F. Wrobel, F. Saigne, and L. Dilillo. 2012. “Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress.” IEEE Transactions on Nuclear Science 59 (4): 893–99. doi:10.1109/TNS.2012.2187218.