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New sample holder geometry for high precision isotope analyses.
- Source :
-
Surface & Interface Analysis: SIA . Jan2013, Vol. 45 Issue 1, p553-556. 4p. - Publication Year :
- 2013
-
Abstract
- Secondary ion mass spectrometry is applied to a wide range of Geoscience applications because of its capability to provide direct in situ measurement of elemental and isotopic composition. The CAMECA IMS 1280 and 1280-HR are large geometry ultra-high sensitivity ion microprobes that provide excellent precision and reproducibility for isotope ratio measurements. A precision at the tenth permil level is routinely achieved for the measurement of 18O/16O ratio from 10 µm spots using multicollection Faraday Cups. However, analytical artifacts related to the surface topography and to the location of the analysis in the sample (X-Y effects) are known to bias the precision for isotope analysis. The X-Y effects have been investigated using a CAMECA prototype sample holder design. Results show a significant improvement in terms of reproducibility for analyses performed over a large area of the sample. Detailed analytical data using the new sample holder will be presented. Copyright © 2012 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 01422421
- Volume :
- 45
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Surface & Interface Analysis: SIA
- Publication Type :
- Academic Journal
- Accession number :
- 84385682
- Full Text :
- https://doi.org/10.1002/sia.5061