Back to Search Start Over

X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility.

Authors :
Reverdin, Charles
Thais, Frédéric
Loisel, Guillaume
Busquet, M.
Bastiani-Ceccotti, S.
Blenski, T.
Caillaud, T.
Ducret, J. E.
Foelsner, W.
Gilles, D.
Gilleron, F.
Pain, J. C.
Poirier, M.
Serres, F.
Silvert, V.
Soullie, G.
Turck-Chieze, S.
Villette, B.
Source :
Review of Scientific Instruments. Oct2012, Vol. 83 Issue 10, p10E134-10E134-3. 1p. 2 Diagrams, 7 Graphs.
Publication Year :
2012

Abstract

An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution <E/δE> ∼ 50. It has been used at the LULI-2000 laser facility at École Polytechnique (France) to measure the Δn = 0, n = 3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
83
Issue :
10
Database :
Academic Search Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
82964690
Full Text :
https://doi.org/10.1063/1.4740266