Cite
Optical characterization of textured SnO2:F layers using spectroscopic ellipsometry.
MLA
Akagawa, Masataka, and Hiroyuki Fujiwara. “Optical Characterization of Textured SnO2:F Layers Using Spectroscopic Ellipsometry.” Journal of Applied Physics, vol. 112, no. 8, Oct. 2012, p. 083507. EBSCOhost, https://doi.org/10.1063/1.4759054.
APA
Akagawa, M., & Fujiwara, H. (2012). Optical characterization of textured SnO2:F layers using spectroscopic ellipsometry. Journal of Applied Physics, 112(8), 083507. https://doi.org/10.1063/1.4759054
Chicago
Akagawa, Masataka, and Hiroyuki Fujiwara. 2012. “Optical Characterization of Textured SnO2:F Layers Using Spectroscopic Ellipsometry.” Journal of Applied Physics 112 (8): 083507. doi:10.1063/1.4759054.