Cite
Sub-micron resolution rf cavity beam position monitor system at the SACLA XFEL facility
MLA
Maesaka, H., et al. “Sub-Micron Resolution Rf Cavity Beam Position Monitor System at the SACLA XFEL Facility.” Nuclear Instruments & Methods in Physics Research Section A, vol. 696, Dec. 2012, pp. 66–74. EBSCOhost, https://doi.org/10.1016/j.nima.2012.08.088.
APA
Maesaka, H., Ego, H., Inoue, S., Matsubara, S., Ohshima, T., Shintake, T., & Otake, Y. (2012). Sub-micron resolution rf cavity beam position monitor system at the SACLA XFEL facility. Nuclear Instruments & Methods in Physics Research Section A, 696, 66–74. https://doi.org/10.1016/j.nima.2012.08.088
Chicago
Maesaka, H., H. Ego, S. Inoue, S. Matsubara, T. Ohshima, T. Shintake, and Y. Otake. 2012. “Sub-Micron Resolution Rf Cavity Beam Position Monitor System at the SACLA XFEL Facility.” Nuclear Instruments & Methods in Physics Research Section A 696 (December): 66–74. doi:10.1016/j.nima.2012.08.088.