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Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology

Authors :
Sarafianos, A.
Llido, R.
Dutertre, J.M.
Gagliano, O.
Serradeil, V.
Lisart, M.
Goubier, V.
Tria, A.
Pouget, V.
Lewis, D.
Source :
Microelectronics Reliability. Sep2012, Vol. 52 Issue 9/10, p2035-2038. 4p.
Publication Year :
2012

Abstract

Abstract: This paper presents the electrical model of a PMOS transistor in 90nm technology under 1064nm Photoelectric Laser Stimulation. The model was built and tuned from measurements made on test structures. It permits to simulate the effect of a continuous wave laser on a PMOS transistor by taking into account the laser’s parameters (i.e. spot size and location, or power) and the PMOS’ geometry and bias. It offers a significant gain of time by comparison with experiments and makes possible to build 3D photocurrent cartographies generated by the laser on the PMOS. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262714
Volume :
52
Issue :
9/10
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
80183391
Full Text :
https://doi.org/10.1016/j.microrel.2012.06.047