Cite
Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction
MLA
Ma, C. H., et al. “Residual Stress Measurement in Textured Thin Film by Grazing-Incidence X-Ray Diffraction.” Thin Solid Films, vol. 418, no. 2, Oct. 2002, p. 73. EBSCOhost, https://doi.org/10.1016/S0040-6090(02)00680-6.
APA
Ma, C.-H., Huang, J.-H., & Chen, H. (2002). Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction. Thin Solid Films, 418(2), 73. https://doi.org/10.1016/S0040-6090(02)00680-6
Chicago
Ma, C.-H., J.-H. Huang, and Haydn Chen. 2002. “Residual Stress Measurement in Textured Thin Film by Grazing-Incidence X-Ray Diffraction.” Thin Solid Films 418 (2): 73. doi:10.1016/S0040-6090(02)00680-6.