EFFECTS OF POST-ANNEALING ON THE MICROSTRUCTURAL AND ELECTRICAL PROPERTIES OF AMORPHOUS 3 FILM GROWN ON.

MLA

Liu, B. T., et al. “Effects of Post-Annealing on the Microstructural and Electrical Properties of Amorphous 3 Film Grown On.” Modern Physics Letters B, vol. 26, no. 23, Sept. 2012, p. 1. EBSCOhost, https://doi.org/10.1142/S0217984912501485.

APA

Liu, B. T., Zhang, X. G., Yang, L., Li, M., Dai, P. C., Chen, J. H., & Ma, L. X. (2012). Effects of Post-Annealing on the Microstructural and Electrical Properties of Amorphous 3 Film Grown on. Modern Physics Letters B, 26(23), 1. https://doi.org/10.1142/S0217984912501485

Chicago

Liu, B. T., X. G. Zhang, L. Yang, M. Li, P. C. Dai, J. H. Chen, and L. X. Ma. 2012. “Effects of Post-Annealing on the Microstructural and Electrical Properties of Amorphous 3 Film Grown On.” Modern Physics Letters B 26 (23): 1. doi:10.1142/S0217984912501485.