Back to Search
Start Over
Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR
- Source :
-
Applied Surface Science . Jun2002, Vol. 194 Issue 1-4, p234. 5p. - Publication Year :
- 2002
-
Abstract
- The advent of intense positron beams makes it possible to perform depth-selective 2D-ACAR (two-dimensional angular correlation of annihilation radiation) studies. The Delft POSH–ACAR setup employs a strong permanent magnet for focusing of the POSH beam on the sample, which leads to a ∼15% spread in implantation energy. The effects of this spread on positron depth-profiling data are discussed, and are shown to be consistent with Doppler experiments on Si(1 0 0) with a subsurface layer of nanocavities. A method is presented to decompose depth-selective 2D-ACAR spectra reliably into their various (layer) components. This is used to reveal strong positron trapping in the nanocavities in Si(1 0 0). [Copyright &y& Elsevier]
- Subjects :
- *POSITRON beams
*ANGULAR correlations (Nuclear physics)
Subjects
Details
- Language :
- English
- ISSN :
- 01694332
- Volume :
- 194
- Issue :
- 1-4
- Database :
- Academic Search Index
- Journal :
- Applied Surface Science
- Publication Type :
- Academic Journal
- Accession number :
- 7841449
- Full Text :
- https://doi.org/10.1016/S0169-4332(02)00123-X