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Structural and electrical properties of annealed CdSe films on Ni substrate

Authors :
Athanassopoulou, M.D.
Mergos, J.A.
Palaiologopoulou, M.D.
Argyropoulos, Th.G.
Dervos, C.T.
Source :
Thin Solid Films. Aug2012, Vol. 520 Issue 21, p6515-6520. 6p.
Publication Year :
2012

Abstract

Abstract: Preparation and characterization of CdSe thin film semiconductors, prepared by cathodic electrodeposition from an acid sulphate solution (CdSO4–SeO2) before and after thermal treatment in nitrogen atmosphere, were investigated. The effect of the bath temperature and how it affects the cadmium selenide (CdSe) deposits were studied. The formation of compact barrier layers of zinc blende CdSe was attained. Scanning electron microscopy and X-ray diffraction patterns present a remarkably intense cubic structure, even after thermal treatment. The Ni/CdSe/Au structure may exhibit rectifying properties depending on the temperature during the electrodeposition. Thermal annealing in nitrogen gas increases the conductivity of CdSe and intensifies the rectification properties of the Ni/CdSe/Au structure. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00406090
Volume :
520
Issue :
21
Database :
Academic Search Index
Journal :
Thin Solid Films
Publication Type :
Academic Journal
Accession number :
78278911
Full Text :
https://doi.org/10.1016/j.tsf.2012.06.071