Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)

Details

Language :

English

ISSN :

00262714

Volume :

42

Issue :

9-11

Database :

Academic Search Index

Journal :

Microelectronics Reliability

Publication Type :

Academic Journal

Accession number :

7786645

Full Text :

https://doi.org/10.1016/s0026-2714(02)00217-2