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Dependence of exchange bias field on composition of stabilizing layer and sputtering process in synthetic ferrimagnetic coupled media

Authors :
Djayaprawira, D.D.
Komiyama, K.
Yoshimura, S.
Michalke, T.
Takahashi, M.
Source :
Journal of Magnetism & Magnetic Materials. Feb2002, Vol. 239 Issue 1-3, p396. 3p.
Publication Year :
2002

Abstract

The effect of exchange field <f>Hex</f> on media properties and the dependence of <f>Hex</f> on composition of stabilizing layers and sputtering process in SF media have been examined. It is revealed that to increase <f>Hex</f>, it is necessary to increase the saturation magnetization of the ferromagnetic layers and to reduce the interface roughness. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
03048853
Volume :
239
Issue :
1-3
Database :
Academic Search Index
Journal :
Journal of Magnetism & Magnetic Materials
Publication Type :
Academic Journal
Accession number :
7769611
Full Text :
https://doi.org/10.1016/S0304-8853(01)00632-1