Cite
Evaluation of imperfections in silica and chalcogenide glass microspheres using focussed ion beam milling and imaging.
MLA
Kane, D. M., et al. “Evaluation of Imperfections in Silica and Chalcogenide Glass Microspheres Using Focussed Ion Beam Milling and Imaging.” Journal of Microscopy, vol. 247, no. 2, Aug. 2012, pp. 186–95. EBSCOhost, https://doi.org/10.1111/j.1365-2818.2012.03631.x.
APA
Kane, D. M., Chater, R. J., & Mcphail, D. S. (2012). Evaluation of imperfections in silica and chalcogenide glass microspheres using focussed ion beam milling and imaging. Journal of Microscopy, 247(2), 186–195. https://doi.org/10.1111/j.1365-2818.2012.03631.x
Chicago
Kane, D.M., R.J. Chater, and D.S. Mcphail. 2012. “Evaluation of Imperfections in Silica and Chalcogenide Glass Microspheres Using Focussed Ion Beam Milling and Imaging.” Journal of Microscopy 247 (2): 186–95. doi:10.1111/j.1365-2818.2012.03631.x.