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Thickness dependence of the phase transition temperature in Ag2Se thin films.
- Source :
-
Journal of Applied Physics . 9/1/1990, Vol. 68 Issue 5, p2105. 7p. 6 Graphs. - Publication Year :
- 1990
-
Abstract
- Evaluates the thickness dependence of the phase transition temperature in Ag[sub2]Se thin films. Experimental procedure; Results of the study; Conclusions.
- Subjects :
- *THIN films
*PHASE transitions
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 68
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7669047
- Full Text :
- https://doi.org/10.1063/1.346565