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Surface-related low-frequency noise of sputtered copper film.

Authors :
Wong, H.
Cheng, Y. C.
Ruan, G.
Source :
Journal of Applied Physics. 1/1/1990, Vol. 67 Issue 1, p312. 5p. 7 Graphs.
Publication Year :
1990

Abstract

Presents the first attempt in correlating the low-frequency noise with the surface characteristics of metal films prepared by sputtering of copper onto oxidized-silicon and sapphire substrates. Noise behaviors and the surface physics of metal films on the substrates; Dependence of the spectral slope of noise spectrum on the thickness and surface area of the metal films; Basic mechanism of the surface noise in metal film.

Details

Language :
English
ISSN :
00218979
Volume :
67
Issue :
1
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7667995
Full Text :
https://doi.org/10.1063/1.345254