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Surface-related low-frequency noise of sputtered copper film.
- Source :
-
Journal of Applied Physics . 1/1/1990, Vol. 67 Issue 1, p312. 5p. 7 Graphs. - Publication Year :
- 1990
-
Abstract
- Presents the first attempt in correlating the low-frequency noise with the surface characteristics of metal films prepared by sputtering of copper onto oxidized-silicon and sapphire substrates. Noise behaviors and the surface physics of metal films on the substrates; Dependence of the spectral slope of noise spectrum on the thickness and surface area of the metal films; Basic mechanism of the surface noise in metal film.
- Subjects :
- *NOISE
*COPPER
*SPUTTERING (Physics)
*SILICON
*SAPPHIRES
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 67
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7667995
- Full Text :
- https://doi.org/10.1063/1.345254