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Electrical and optical characterization of GdSi2 and ErSi2 alloy thin films.

Authors :
Guizzetti, G.
Mazzega, E.
Michelini, M.
Nava, F.
Borghesi, A.
Piaggi, A.
Source :
Journal of Applied Physics. 4/1/1990, Vol. 67 Issue 7, p3393. 7p. 2 Charts, 6 Graphs.
Publication Year :
1990

Abstract

Investigates the electrical and optical properties of gadolinium and erbium disilicide. Reason for the interest in transition-metal silicides; X-ray diffractometry used in identifying the silicide phases present in the films; Depth composition and film thickness of the silicides.

Subjects

Subjects :
*SILICIDES
*TRANSITION metals
*GADOLINIUM
*ERBIUM

Details

Language :
English
ISSN :
00218979
Volume :
67
Issue :
7
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7667724
Full Text :
https://doi.org/10.1063/1.345351
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