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Resistivity and its temperature dependence of nanostructured NiAl at temperatures from 77 to 300 K.

Authors :
Qin, X. Y.
Zhang, L. D.
Wu, B. M.
Tian, M. L.
Du, Y. L.
Yang, D. S.
Cao, L. Z.
Source :
Journal of Applied Physics. 10/15/1996, Vol. 80 Issue 8, p4776. 3p. 1 Black and White Photograph, 3 Graphs.
Publication Year :
1996

Abstract

Presents information on a study that investigated direct current resistivity and its temperature dependence for macrostructured NiAl. Types of defects in n-material; Two aspects in which the interaction of interfaces with the conduction electrons is manifested.

Details

Language :
English
ISSN :
00218979
Volume :
80
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7663834
Full Text :
https://doi.org/10.1063/1.363417