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Scanning tunneling microscope investigation of the growth morphology of titanium silicide on Si(111) substrates.

Authors :
Stephenson, A. W.
Welland, M. E.
Source :
Journal of Applied Physics. 10/15/1995, Vol. 78 Issue 8, p5143. 12p. 8 Black and White Photographs, 2 Charts.
Publication Year :
1995

Abstract

Details a study which investigated the growth, morphology and surface atomic structure of ultrathin silicide films on silicon substrates. Experimental procedures; Agglomeration of ultrathin titanium silicide; Temperature dependence of crystalline formation; Correlation between silicide agglomeration and crystalline growth.

Details

Language :
English
ISSN :
00218979
Volume :
78
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7663773
Full Text :
https://doi.org/10.1063/1.359747