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Atomic structure of Si/TbSi2/(111)Si double-heterostructure interfaces.

Authors :
Luo, C. H.
Chen, F. R.
Chen, L. J.
Source :
Journal of Applied Physics. 11/15/1994, Vol. 76 Issue 10, p5744. 4p. 7 Diagrams.
Publication Year :
1994

Abstract

Deals with a study which analyzed the atomic structure of the Si/TbSi[sub2](111)Si double-heterostructure interfaces using high-resolution transmission electron microscopy. Experimental procedures; Coincident-site lattice models of interface structure; Conclusions.

Subjects

Subjects :
*INTERFACES (Physical sciences)
*TRANSMISSION electron microscopy

Details

Language :
English
ISSN :
00218979
Volume :
76
Issue :
10
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7663575
Full Text :
https://doi.org/10.1063/1.358411
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