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Electron trapping in α-alumina observed by electron-induced x-ray emission.

Authors :
Jonnard, P.
Vergand, F.
Kefi, M.
Bonnelle, C.
Source :
Journal of Applied Physics. 3/15/1996, Vol. 79 Issue 6, p2909. 4p. 1 Chart, 4 Graphs.
Publication Year :
1996

Abstract

Presents information on a study which examined electron trapping in the band gap of single-crystal alumina by electron-induced x-ray emission spectroscopy. Defects existing in insulator materials; Results; Discussion.

Details

Language :
English
ISSN :
00218979
Volume :
79
Issue :
6
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7662911
Full Text :
https://doi.org/10.1063/1.361221