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Microscopic photoluminescence characterization of 1.3-μm InAsP/InGaAsP strained multiquantum wells and laser diodes.
- Source :
-
Journal of Applied Physics . 9/1/1995, Vol. 78 Issue 5, p3462. 5p. - Publication Year :
- 1995
-
Abstract
- Presents the results of a microscopic photoluminescence (PL) characterization of strained indium-arsenic-phosphorus/indium-gallium-arsenic-phosphorus multiquantum well crystals. PL intensity profile measurements of a laser diode cavity; Importance of semiconductor laser diodes in optical subscriber communication systems; Information on chemical beam epitaxy.
- Subjects :
- *PHOTOLUMINESCENCE
*INDIUM compounds
*DIODES
*EPITAXY
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 78
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7660437
- Full Text :
- https://doi.org/10.1063/1.359978