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Photoreflectance study of Si delta-doped low-temperature GaAs grown by molecular beam epitaxy.
- Source :
-
Journal of Applied Physics . 3/1/1995, Vol. 77 Issue 5, p2124. 4p. 4 Graphs. - Publication Year :
- 1995
-
Abstract
- Investigates the surface electric field of silicon delta-doped GaAs grown by molecular beam epitaxy at a low substrate temperature using photoreflectance spectroscopy. Observations on Franz-Keldysh oscillations in the reflectance spectra; Explanation for the evolution of photoreflectance spectra; Use of photoreflectance in the study of semiconductors.
- Subjects :
- *ELECTRIC fields
*SILICON
*GALLIUM arsenide
*OSCILLATIONS
*REFLECTANCE spectroscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 77
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7659610
- Full Text :
- https://doi.org/10.1063/1.358788