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Photoreflectance study of Si delta-doped low-temperature GaAs grown by molecular beam epitaxy.

Authors :
Cheng, T. M.
Chang, C. Y.
Hsu, T. M.
Lee, W. C.
Huang, J. H.
Source :
Journal of Applied Physics. 3/1/1995, Vol. 77 Issue 5, p2124. 4p. 4 Graphs.
Publication Year :
1995

Abstract

Investigates the surface electric field of silicon delta-doped GaAs grown by molecular beam epitaxy at a low substrate temperature using photoreflectance spectroscopy. Observations on Franz-Keldysh oscillations in the reflectance spectra; Explanation for the evolution of photoreflectance spectra; Use of photoreflectance in the study of semiconductors.

Details

Language :
English
ISSN :
00218979
Volume :
77
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7659610
Full Text :
https://doi.org/10.1063/1.358788