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Reinvestigation and extension of the steady-state Nyquist theorem for multi-terminal semiconductor devices and its application to minimum noise figure in microwave field effect transistors.
- Source :
-
Journal of Applied Physics . 1/1/1996, Vol. 79 Issue 1, p228. 14p. - Publication Year :
- 1996
-
Abstract
- Focuses on a study which reinvestigated the steady-state Nyquist theorem for multi-terminal semiconductor devices and its application to minimum noise figure in microwave field effect transistors. Discussion on the existing thermal noise theories for multi-terminal semiconductor devices; Methodology of the study; Results and discussion.
- Subjects :
- *SEMICONDUCTORS
*FIELD-effect transistors
*MICROWAVES
*NOISE
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 79
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7659121
- Full Text :
- https://doi.org/10.1063/1.360936