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Recrystallization of a planar amorphous-crystalline interface in silicon by low energy recoils: A molecular dynamics study.
- Source :
-
Journal of Applied Physics . 4/1/1995, Vol. 77 Issue 7, p3121. 5p. 5 Graphs. - Publication Year :
- 1995
-
Abstract
- Deals with a study which described the motion of an amorphous-crystalline interface in silicon induced by low energy recoils. Model description; Results; Discussion.
- Subjects :
- *AMORPHOUS substances
*CRYSTALLINE interfaces
*SILICON
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 77
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7658370
- Full Text :
- https://doi.org/10.1063/1.358664