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Thin heteroepitaxial Si-on-sapphire films grown at 600 °C by reactive ion beam deposition.

Authors :
Yamada, Hiroshi
Torii, Yasuhiro
Source :
Journal of Applied Physics. 11/1/1988, Vol. 64 Issue 9, p4509. 7p. 2 Black and White Photographs, 2 Diagrams, 4 Graphs.
Publication Year :
1988

Abstract

Presents a study that investigated the heteroepitaxial growth of silicon thin films on sapphire at temperature. Analysis of the film growth through a fixed ion energy; Evaluation of the growth of the thin films by accommodating the ion energy to two film growth stages; Conclusions.

Details

Language :
English
ISSN :
00218979
Volume :
64
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7656454
Full Text :
https://doi.org/10.1063/1.341278