Carrier injection, transport, and their effects on photoinduced dielectric breakdown in single crystalline paraffin (n-C36H74).

Presents information on a study which investigated carrier injection and transport in single crystalline paraffin on the basis of time-of-flight (TOF) data and direct current-photo injection experiments. Questions with regard to the microscopic behavior of charge carriers; Experimental setup; Results of TOF experiments; Discussion of photoinduced dielectric breakdown behavior.