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Plasma structures in an electron cyclotron resonance plasma processing device.

Authors :
Iizuka, Satoru
Sato, Noriyoshi
Source :
Journal of Applied Physics. 10/15/1991, Vol. 70 Issue 8, p4165. 7p. 1 Diagram, 10 Graphs.
Publication Year :
1991

Abstract

Presents a study that investigated the basic characteristics of the electron cyclotron resonance (ECR) plasma produced in the standard NTT-type plasma chemical vapor deposition device. Use of the ECR; Measurement of the radial plasma profiles; Analysis of the axial plasma profiles.

Details

Language :
English
ISSN :
00218979
Volume :
70
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7637793
Full Text :
https://doi.org/10.1063/1.349139