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Properties of Si-rich SiNx:H films prepared by plasma-enhanced chemical vapor deposition.

Authors :
Kaya, Çetin
Ma, Tso-Ping
Chen, Tze-Chiang
Barker, Richard C.
Source :
Journal of Applied Physics. 10/15/1988, Vol. 64 Issue 8, p3949. 9p. 8 Diagrams, 1 Chart, 8 Graphs.
Publication Year :
1988

Abstract

Presents a study that investigated silicon-rich silicon nitride films prepared by plasma-enhanced chemical vapor deposition technique. Experimental procedure; Results; Discussion.

Details

Language :
English
ISSN :
00218979
Volume :
64
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7637495
Full Text :
https://doi.org/10.1063/1.341352