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Layer thickness dependence of magnetic properties in Mn/Al multilayers.

Authors :
Hirayama, Y.
Takeuchi, T.
Futamoto, M.
Source :
Journal of Applied Physics. 5/15/1993, Vol. 73 Issue 10, p6441. 3p. 1 Black and White Photograph, 5 Graphs.
Publication Year :
1993

Abstract

Examines the relationships between the magnetic properties and the film structure of manganese/aluminum multilayers. X-ray diffractions; Comparison between saturation magnetization and magnetic anisotropy; Difference of the magnetic anisotropy in the hysteresis curves.

Subjects

Subjects :
*MAGNETIZATION
*X-ray diffraction
*ANISOTROPY
*HYSTERESIS

Details

Language :
English
ISSN :
00218979
Volume :
73
Issue :
10
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7634901
Full Text :
https://doi.org/10.1063/1.352626
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