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High-frequency capacitive effects in resonant tunneling diodes.

Authors :
Lu, X. J.
Rhodes, D.
Perlman, B. S.
Source :
Journal of Applied Physics. 8/15/1993, Vol. 74 Issue 4, p2908. 6p.
Publication Year :
1993

Abstract

Reports on the calculation of the time-varying charge buildup in the quantum well region of a resonant tunneling diode (RTD) and related capacitive effects using the scattering matrix method. Band structure of a resonant tunneling diode under bias; Scattering matrix between regions with different modulation phases; Discussion on the capacitive effect in a RTD.

Details

Language :
English
ISSN :
00218979
Volume :
74
Issue :
4
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7627057
Full Text :
https://doi.org/10.1063/1.355292