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Effect of the presence of Ge in Er compound on the barrier height formation of Er-Si contacts.
- Source :
-
Journal of Applied Physics . 8/15/1985, Vol. 58 Issue 4, p1601. 5p. - Publication Year :
- 1985
-
Abstract
- Investigates the effects of germanium in the erbium film on the barrier height. Sample preparation; Role of an interfacial layer in barrier formation.
- Subjects :
- *GERMANIUM
*ERBIUM
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 58
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7626090
- Full Text :
- https://doi.org/10.1063/1.336047