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Positrons provide sensitive measure of defects.
- Source :
-
Laser Focus World . Sep2001, Vol. 37 Issue 9, p46. 2p. - Publication Year :
- 2001
-
Abstract
- Reports on the development of a scanning positron microscope (SPM), which measure material defects with high resolution than electron or optical microscopy, by researchers at the Military University in Munich, Germany in September 2001. Applications of the SPM; Factors which affect the sensitivity of SPM; Processes involved in the development of SPM.
- Subjects :
- *SCANNING probe microscopy
*OPTICS
Subjects
Details
- Language :
- English
- ISSN :
- 10438092
- Volume :
- 37
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Laser Focus World
- Publication Type :
- Periodical
- Accession number :
- 7598204