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Room-temperature diffusive phenomena in semiconductors: The case of AIGaN.

Authors :
Warnick, Keith H.
Puzyrev, Yevgeniy
Roy, Tania
Fleetwood, Daniel M.
Schrimpf, Ronald D.
Pantelides, Sokrates T.
Source :
Physical Review B: Condensed Matter & Materials Physics. Dec2011, Vol. 84 Issue 21, p214109-1-214109-5. 5p.
Publication Year :
2011

Abstract

Diffusion mediated by native point defects does not generally occur in semiconductors at room temperature (RT) because of high activation energies. However, recently observed plastic deformation in AIGaN/GaN structures in the presence of strain and electric fields was attributed to diffusive processes. Here, we report first-principles calculations showing that strain has little effect, but RT mass transport is enabled by near-zero formation energy of triply negative cation vacancies and a concomitant electric-field-induced lowering of migration energy. Similar phenomena are predicted to occur in other large-gap materials. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10980121
Volume :
84
Issue :
21
Database :
Academic Search Index
Journal :
Physical Review B: Condensed Matter & Materials Physics
Publication Type :
Academic Journal
Accession number :
74630781
Full Text :
https://doi.org/10.1103/PhysRevB.84.214109