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Room-temperature diffusive phenomena in semiconductors: The case of AIGaN.
- Source :
-
Physical Review B: Condensed Matter & Materials Physics . Dec2011, Vol. 84 Issue 21, p214109-1-214109-5. 5p. - Publication Year :
- 2011
-
Abstract
- Diffusion mediated by native point defects does not generally occur in semiconductors at room temperature (RT) because of high activation energies. However, recently observed plastic deformation in AIGaN/GaN structures in the presence of strain and electric fields was attributed to diffusive processes. Here, we report first-principles calculations showing that strain has little effect, but RT mass transport is enabled by near-zero formation energy of triply negative cation vacancies and a concomitant electric-field-induced lowering of migration energy. Similar phenomena are predicted to occur in other large-gap materials. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10980121
- Volume :
- 84
- Issue :
- 21
- Database :
- Academic Search Index
- Journal :
- Physical Review B: Condensed Matter & Materials Physics
- Publication Type :
- Academic Journal
- Accession number :
- 74630781
- Full Text :
- https://doi.org/10.1103/PhysRevB.84.214109