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Structural reorientation of PLD grown La2NiO4 thin films
- Source :
-
Surface Science . May2012, Vol. 606 Issue 9/10, p865-871. 7p. - Publication Year :
- 2012
-
Abstract
- Abstract: Single crystal La2NiO4 films were grown on STO (001) substrates by use of pulsed laser deposition (PLD). It was found that these films grow with the c-axis in the out of plane direction up to a certain critical thickness. Films thicker than that resulted in a structural reorientation from c-axis to a-axis out of plane orientation. The evolution of the c and a axis were measured by using a four circle X-ray diffractometer. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00396028
- Volume :
- 606
- Issue :
- 9/10
- Database :
- Academic Search Index
- Journal :
- Surface Science
- Publication Type :
- Academic Journal
- Accession number :
- 73524286
- Full Text :
- https://doi.org/10.1016/j.susc.2012.02.001