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Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy - magnetic vs. dither piezo excitation.
- Source :
-
Journal of Applied Physics . Mar2012, Vol. 111 Issue 5, p054303. 5p. 2 Color Photographs, 1 Diagram, 1 Graph. - Publication Year :
- 2012
-
Abstract
- Force modulation atomic force microscopy is widely used for mapping the nanoscale mechanical properties of heterogeneous or composite materials using low frequency excitation of a microcantilever scanning the surface. Here we show that the excitation mode - magnetic or dither piezo, has a major influence on the surface-coupled microcantilever dynamics. Not only is the observed material property contrast inverted between these excitation modes but also the frequency response of the surface-coupled cantilever in the magnetic mode is near-ideal with a clear resonance peak and little phase distortion thus enabling quantitative mapping of the local mechanical properties. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 111
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 73444065
- Full Text :
- https://doi.org/10.1063/1.3689815