Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM.

Near-edge X-ray absorption spectroscopy (NEXAFS) is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures. Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/?E = 1 × 104 with a spatial resolution of 25 nm in a field of view of 15-20 µm and a data acquisition time of ?1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies. [ABSTRACT FROM AUTHOR]