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Multielectron processes in collisions of Xe ions with Ar atoms.

Authors :
Ding, B.
Yu, D.
Shao, C.
Lu, R.
Ruan, F.
Li, H.
Zhang, W.
Cai, X.
Source :
European Physical Journal D (EPJ D). Dec2011, Vol. 65 Issue 3, p391-396. 6p.
Publication Year :
2011

Abstract

We report the measurements of relative cross sections for multielectron processes in collisions of Xe ions with argon atoms in the velocity range of 0.65-1.32 a.u. By means of the coincidence time-of-flight (TOF) technique, the final charge states of both the projectile and target ions for each collision event are determined. The present experimental data are compared with the scaling law by Selberg et al. [Phys. Rev. A 54, 4127 (1996)] and the extended classical over-barrier (ECB) model. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14346060
Volume :
65
Issue :
3
Database :
Academic Search Index
Journal :
European Physical Journal D (EPJ D)
Publication Type :
Academic Journal
Accession number :
69836204
Full Text :
https://doi.org/10.1140/epjd/e2011-20511-7