Comparison of magnetic- and chemical-boundary roughness in magnetic films and multilayers.

Diffuse x-ray resonant magnetic scattering, atomic-force microscopy, and magnetic hysteresis measurements are used to explore the relationship between the roughness and magnetic properties of interfaces between magnetic and nonmagnetic thin films. Bare Co films and Co films capped with magnetic and nonmagnetic thin films are investigated to elucidate why and under what circumstances the magnetic boundary differs from the chemical boundary. Competing models to explain why the magnetic boundary appears smoother than the chemical boundary are explored. [ABSTRACT FROM AUTHOR]