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Electron microscope gets x-ray vision.

Authors :
Feder, Toni
Source :
Physics Today. Oct2011, Vol. 64 Issue 10, p28-29. 2p.
Publication Year :
2011

Abstract

The article offers information on the x-ray vision of the Austrian scanning transmission electron microscope (ASTEM). The x rays in ASTEM come from atoms relaxing after core electrons get ejected. It says that analyzing material interfaces and impurities in semiconductor devices and examining nanoplasmonics are among the anticipated applications of ASTEM. Ferdinand Hofer of the Austrian Center for Electron Microscopy and Nanoanalysis adds that it can be used to study biomaterials.

Details

Language :
English
ISSN :
00319228
Volume :
64
Issue :
10
Database :
Academic Search Index
Journal :
Physics Today
Publication Type :
Academic Journal
Accession number :
66757424
Full Text :
https://doi.org/10.1063/PT.3.1290