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Electron microscope gets x-ray vision.
- Source :
-
Physics Today . Oct2011, Vol. 64 Issue 10, p28-29. 2p. - Publication Year :
- 2011
-
Abstract
- The article offers information on the x-ray vision of the Austrian scanning transmission electron microscope (ASTEM). The x rays in ASTEM come from atoms relaxing after core electrons get ejected. It says that analyzing material interfaces and impurities in semiconductor devices and examining nanoplasmonics are among the anticipated applications of ASTEM. Ferdinand Hofer of the Austrian Center for Electron Microscopy and Nanoanalysis adds that it can be used to study biomaterials.
Details
- Language :
- English
- ISSN :
- 00319228
- Volume :
- 64
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Physics Today
- Publication Type :
- Academic Journal
- Accession number :
- 66757424
- Full Text :
- https://doi.org/10.1063/PT.3.1290