Investigation of Electronic Transport in Lateral NiFe/Al2O3/p-Si/Al2O3/NiFe Junctions.

MLA

Lee, Y. C., et al. “Investigation of Electronic Transport in Lateral NiFe/Al2O3/p-Si/Al2O3/NiFe Junctions.” IEEE Transactions on Magnetics, vol. 47, no. 10, Oct. 2011, pp. 4147–50. EBSCOhost, https://doi.org/10.1109/TMAG.2011.2153192.

APA

Lee, Y. C., Lin, C. W., Lee, H. M., Horng, L., & Wu, J. C. (2011). Investigation of Electronic Transport in Lateral NiFe/Al2O3/p-Si/Al2O3/NiFe Junctions. IEEE Transactions on Magnetics, 47(10), 4147–4150. https://doi.org/10.1109/TMAG.2011.2153192

Chicago

Lee, Y. C., C. W. Lin, H. M. Lee, L. Horng, and J. C. Wu. 2011. “Investigation of Electronic Transport in Lateral NiFe/Al2O3/p-Si/Al2O3/NiFe Junctions.” IEEE Transactions on Magnetics 47 (10): 4147–50. doi:10.1109/TMAG.2011.2153192.