Development of an Advanced Sample-Scanning Stage System Prototype for an MLL-Based Hard X-ray Nanoprobe.

The scientists and engineers at Argonne and Brookhaven are collaborating to develop a new nanopositioning system for the NSLS-II Hard X-ray Nanoprobe. In this paper we present the design and development of an advanced sample-scanning stage system prototype for an MLL-based hard x-ray nanoprobe. The design and prototyping activities for the Brookhaven NSLS-II nanopositioning system will also benefit the ongoing development of the Argonne CNM/APS MLL-based hard x-ray nanoprobe with hard x-ray focusing in the nanometer scale. [ABSTRACT FROM AUTHOR]