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On Automatic-Verification Pattern Generation for SoC With Port-Order Fault Model.

Authors :
Chun-Yao Wang
Shing-Wu Tung
Jing-Yang Jou
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Apr2002, Vol. 21 Issue 4, p466. 14p. 3 Black and White Photographs, 18 Diagrams, 2 Charts.
Publication Year :
2002

Abstract

Presents an automatic-verification pattern generation (AVPG) for system-on-a-chip design verification based on the port-order fault (POF) model. Details of experiments on combinational and sequential benchmarks; Mechanism of conducting POF verification; Description of a verification pattern generation algorithm; Discussion on the combinational AVPG.

Subjects

Subjects :
*COMPUTER circuits
*ALGORITHMS

Details

Language :
English
ISSN :
02780070
Volume :
21
Issue :
4
Database :
Academic Search Index
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
6459311
Full Text :
https://doi.org/10.1109/43.992770