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Heavy ion beam probe systems for tight aspect ratio toKamaKs
- Source :
-
Review of Scientific Instruments . Jan1997, Vol. 68 Issue 1, p316. 4p. 4 Diagrams, 1 Chart, 6 Graphs. - Publication Year :
- 1997
-
Abstract
- Discusses the specific features of the application of heavy ion beam probe systems to tight aspect ratio tokamaks. Brief description of the observed tokamaks from the viewpoint of the probing beam pass; Optimization procedure; Three-dimensional case.
- Subjects :
- *ION bombardment
*HEAVY ions
*PLASMA probes
*TOKAMAKS
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 68
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 630707
- Full Text :
- https://doi.org/10.1063/1.1147859