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Heavy ion beam probe systems for tight aspect ratio toKamaKs

Authors :
Melnikov, A. V.
Zimeleva, L. G.
Krupnik, L. I.
Nedzelskij, I. S.
Trofimenko, Y. V.
Minaev, V. B.
Source :
Review of Scientific Instruments. Jan1997, Vol. 68 Issue 1, p316. 4p. 4 Diagrams, 1 Chart, 6 Graphs.
Publication Year :
1997

Abstract

Discusses the specific features of the application of heavy ion beam probe systems to tight aspect ratio tokamaks. Brief description of the observed tokamaks from the viewpoint of the probing beam pass; Optimization procedure; Three-dimensional case.

Details

Language :
English
ISSN :
00346748
Volume :
68
Issue :
1
Database :
Academic Search Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
630707
Full Text :
https://doi.org/10.1063/1.1147859