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Thickness measurement of colloidal opal crystal growth by Bragg reflection
- Source :
-
Journal of Colloid & Interface Science . Aug2011, Vol. 360 Issue 2, p331-334. 4p. - Publication Year :
- 2011
-
Abstract
- Abstract: This study investigates a simple method for thickness estimation with single layer accuracy for self-assembling opal crystals prepared by the dip-coating method. The thickness (number of layers) of the opal crystals was estimated by an analysis of the optical reflectance from s-polarization incident light, and then verified with SEM. The opal crystals were considered as periodic dielectric layers and were analyzed with the transfer matrix method. The reflectance simulation showed a good agreement with the experimental results. The lattice constant and the thickness were determined at the peak position and by the fringes of the reflection spectra, respectively. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00219797
- Volume :
- 360
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Journal of Colloid & Interface Science
- Publication Type :
- Academic Journal
- Accession number :
- 61494157
- Full Text :
- https://doi.org/10.1016/j.jcis.2011.04.090