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Thickness measurement of organic films using Compton scattering of characteristic X-rays
- Source :
-
Applied Radiation & Isotopes . Sep2011, Vol. 69 Issue 9, p1241-1245. 5p. - Publication Year :
- 2011
-
Abstract
- Abstract: An X-ray scattering method is presented for determining the thickness of an organic film placed on a steel substrate. The strong peaks of characteristic X-rays are taken as an advantage to measure the intensity of backscattered photons. It is shown that the intensity of Compton scattering of characteristic X-rays is proportional to film thickness, up to the thickness of 250μm of acrylic adhesive layers. In addition, the measurement time was 300ms, providing a simple and convenient method for on-line for thickness monitoring. [Copyright &y& Elsevier]
- Subjects :
- *THICKNESS measurement
*X-ray scattering
*STEEL
*BACKSCATTERING
*PHOTONS
*MEASUREMENT
Subjects
Details
- Language :
- English
- ISSN :
- 09698043
- Volume :
- 69
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Applied Radiation & Isotopes
- Publication Type :
- Academic Journal
- Accession number :
- 60922269
- Full Text :
- https://doi.org/10.1016/j.apradiso.2011.03.048