Band offset in Zn 0.965 Cd 0.035 O/ZnO bilayer films

Abstract: Zn 0.965 Cd 0.035 O/ZnO bilayer film has been developed using pulsed laser deposition (PLD) technique. The film is characterized by X-ray diffraction (XRD), energy dispersion analysis by X-ray (EDAX), UV-Vis and Valence band spectra (VBS). The XRD pattern confirms the single phase crystalline nature of the deposited film. The UV-Vis spectra establish a reduction of band gap (≈340meV) in the ternary alloy film of Zn 0.965 Cd 0.035 O/ZnO. The VBS shows shift in the peak corresponding to nonbonding oxygen p states. We also obtained valence band offset of 191meV in the film showing the rise of valence band. The calculated conduction band offset is found to be −51meV which confirms the lowering of the conduction band in the ternary alloy film. [Copyright &y& Elsevier]